Next week, Clarity Sensors attends the European Conference on Non-Destructive Testing (ECNDT) in Verona, the first time we have been represented at this conference. ECNDT brings together the leading engineers, researchers, and system integrators working in industrial inspection and related disciplines. It is precisely the community we are building PRISM-X for.

PRISM-X is our second generation photon-counting X-ray detector based on halide perovskite single-crystal semiconductors – a material platform we grow in-house using a proprietary low-temperature crystal growth process. Our single-pixel devices, characterised in late 2025 and early 2026, have demonstrated X-ray sensitivity and signal stability comparable to established CdTe and CZT detector materials, and already surpass them in several measured parameters. This is early-stage data, and we expect performance to improve substantially as we scale and refine our fabrication process.

We are attending to open conversations with X-ray imaging system developers who are evaluating the next generation of X-ray detector technologies. If you are at ECNDT and would like to meet, or if you would like to request our single-pixel device datasheet, please get in touch. [[email protected]]